Datasheet ADG431, ADG432, ADG433 (Analog Devices) - 7
| Fabricante | Analog Devices |
| Descripción | LC2MOS Precision Quad SPST Switch |
| Páginas / Página | 8 / 7 — ADG431/ADG432/ADG433. Test Circuits. IDS. S (OFF). ID (OFF). D (ON). ON = … |
| Revisión | C |
| Formato / tamaño de archivo | PDF / 135 Kb |
| Idioma del documento | Inglés |
ADG431/ADG432/ADG433. Test Circuits. IDS. S (OFF). ID (OFF). D (ON). ON = V1/IDS. +15V. +5V. 0.1. VDD. ADG431. 50%. VOUT. ADG432. 300. 35pF. 90%. GND. VSS. tON
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ADG431/ADG432/ADG433 Test Circuits IDS V1 I I S (OFF) ID (OFF) D (ON) S D S D S D A A A VS V V V R S D S VD ON = V1/IDS
Test Circuit 1. On Resistance Test Circuit 2. Off Leakage Test Circuit 3. On Leakage
+15V +5V 0.1 F 0.1 F 3V VDD VL V ADG431 50% 50% IN S D VOUT 3V R V L CL IN ADG432 50% 50% VS IN 300 35pF 90% 90% GND VSS VOUT 0.1 F tON t –15V OFF
Test Circuit 4. Switching Times
+15V +5V 0.1 F 0.1 F 3V V VIN 50% 50% DD VL 0V S1 D1 VS1 VOUT1 90% 90% R V L1 CL1 OUT1 V S2 OUT2 D2 0V V 300 35pF S2 IN1, IN2 RL2 CL2 300 35pF GND VSS 90% 90% V V IN OUT2 0V 0.1 F tD tD –15V
Test Circuit 5. Break-Before-Make Time Delay
+15V +5V VDD VL 3V R V S S D OUT VIN C V L S 10nF IN VOUT V GND VSS OUT QINJ = CL VOUT –15V
Test Circuit 6. Charge Injection REV. C –7–
Test Circuit 1. On Resistance Test Circuit 2. Off Leakage Test Circuit 3. On Leakage
+15V +5V 0.1 F 0.1 F 3V VDD VL V ADG431 50% 50% IN S D VOUT 3V R V L CL IN ADG432 50% 50% VS IN 300 35pF 90% 90% GND VSS VOUT 0.1 F tON t –15V OFF
Test Circuit 4. Switching Times
+15V +5V 0.1 F 0.1 F 3V V VIN 50% 50% DD VL 0V S1 D1 VS1 VOUT1 90% 90% R V L1 CL1 OUT1 V S2 OUT2 D2 0V V 300 35pF S2 IN1, IN2 RL2 CL2 300 35pF GND VSS 90% 90% V V IN OUT2 0V 0.1 F tD tD –15V
Test Circuit 5. Break-Before-Make Time Delay
+15V +5V VDD VL 3V R V S S D OUT VIN C V L S 10nF IN VOUT V GND VSS OUT QINJ = CL VOUT –15V
Test Circuit 6. Charge Injection REV. C –7–