Datasheet Texas Instruments OPA552UA/2K5 — Ficha de datos

FabricanteTexas Instruments
SerieOPA552
Numero de parteOPA552UA/2K5
Datasheet Texas Instruments OPA552UA/2K5

Amplificadores operacionales de alto voltaje y alta corriente 8-SOIC

Hojas de datos

OPA55x High-Voltage, High-Current Operational Amplifiers datasheet
PDF, 1.2 Mb, Revisión: B, Archivo publicado: enero 7, 2016
Extracto del documento

Precios

Estado

Estado del ciclo de vidaActivo (Recomendado para nuevos diseños)
Disponibilidad de muestra del fabricanteNo

Embalaje

Pin88
Package TypeDD
Industry STD TermSOICSOIC
JEDEC CodeR-PDSO-GR-PDSO-G
Package QTY25002500
CarrierLARGE T&RLARGE T&R
Device Marking552UAOPA
Width (mm)3.913.91
Length (mm)4.94.9
Thickness (mm)1.581.58
Pitch (mm)1.271.27
Max Height (mm)1.751.75
Mechanical DataDescargarDescargar

Paramétricos

Additional FeaturesDecompensated
ArchitectureFET
CMRR(Min)92 dB
CMRR(Typ)102 dB
GBW(Typ)12 MHz
Input Bias Current(Max)100 pA
Iq per channel(Max)8.5 mA
Iq per channel(Typ)7 mA
Number of Channels1
Offset Drift(Typ)7 uV/C
Operating Temperature Range-40 to 125 C
Output Current(Typ)380 mA
Package GroupSOIC
Package Size: mm2:W x L8SOIC: 29 mm2: 6 x 4.9(SOIC) PKG
Rail-to-RailNo
RatingCatalog
Slew Rate(Typ)24 V/us
Total Supply Voltage(Max)60 +5V=5, +/-5V=10
Total Supply Voltage(Min)8 +5V=5, +/-5V=10
Vos (Offset Voltage @ 25C)(Max)3 mV

Plan ecológico

RoHSObediente

Kits de diseño y Módulos de evaluación

  • Evaluation Modules & Boards: OPAMPEVM
    Universal Operational Amplifier Evaluation Module
    Estado del ciclo de vida: Activo (Recomendado para nuevos diseños)

Notas de aplicación

  • Optoelectronics Circuit Collection
    PDF, 261 Kb, Archivo publicado: jun 11, 2001
    This application report presents a collection of analog circuits that may be useful in electro-optic applications such as optical networking. The circuits are Avalanche Photodiode Bias Supply 1; Linear TEC Driver-1, -2, and -3; Laser Diode Driver-1 and -2; and Temperature Under- and Over-range Sensing with a Window Comparator.
  • MTTF, Failrate, Reliability, and Life Testing
    PDF, 51 Kb, Archivo publicado: oct 4, 2000
    At Burr-Brown, we characterize and qualify the reliability of our devices through high temperature life testing. The results of this testing are quantified with such values as MTTF and failure rate. This information can be very valuable when used for comparative purposes or applied to reliablility calculations. However, this information loses its worth if it is not precisely understood and appropr

Linea modelo

Clasificación del fabricante

  • Semiconductors > Amplifiers > Operational Amplifiers (Op Amps) > Power Op Amps