Datasheet Texas Instruments V62/04701-01XE — Ficha de datos

    
 
    SCLS557 -JANUARY 2004 D Controlled Baseline
D
D
D D 2-V to 6-V VCC Operation
D Inputs Accept Voltages to 6 V
D Max tpd of 7.5 ns at 5 V -One Assembly/Test Site, One Fabrication
Site
Enhanced Diminishing Manufacturing
Sources (DMS) Support
Enhanced Product-Change Notification
Qualification Pedigree† D OR PW PACKAGE
(TOP VIEW) 1A
1B
2A
2B
2C
2Y
GND † Component qualification in accordance with JEDEC and industry
standards to ensure reliable operation over an extended
temperature range. This includes, but is not limited to, Highly
Accelerated Stress Test (HAST) or biased 85/85, temperature
cycle, autoclave or unbiased HAST, electromigration, bond …