Datasheet Texas Instruments OPA551FA/500G3 — Ficha de datos

FabricanteTexas Instruments
SerieOPA551
Numero de parteOPA551FA/500G3
Datasheet Texas Instruments OPA551FA/500G3

Amplificadores operacionales de alto voltaje y alta corriente 7-DDPAK / TO-263 -40 a 125

Hojas de datos

OPA55x High-Voltage, High-Current Operational Amplifiers datasheet
PDF, 1.2 Mb, Revisión: B, Archivo publicado: enero 7, 2016
Extracto del documento

Precios

Estado

Estado del ciclo de vidaActivo (Recomendado para nuevos diseños)
Disponibilidad de muestra del fabricanteNo

Embalaje

Pin7
Package TypeKTW
Industry STD TermTO-263
JEDEC CodeR-PSFM-G
Package QTY500
CarrierLARGE T&R
Device MarkingOPA551FA
Width (mm)8.89
Length (mm)10.1
Thickness (mm)4.44
Pitch (mm)1.27
Max Height (mm)4.65
Mechanical DataDescargar

Paramétricos

Additional FeaturesN/A
ArchitectureFET
CMRR(Min)92 dB
CMRR(Typ)102 dB
GBW(Typ)3 MHz
Input Bias Current(Max)100 pA
Iq per channel(Max)8.5 mA
Iq per channel(Typ)7 mA
Number of Channels1
Offset Drift(Typ)7 uV/C
Operating Temperature Range-40 to 125 C
Output Current(Typ)380 mA
Package GroupDDPAK/TO-263
Package Size: mm2:W x L7DDPAK/TO-263: 154 mm2: 15.24 x 10.1(DDPAK/TO-263) PKG
Rail-to-RailNo
RatingCatalog
Slew Rate(Typ)15 V/us
Total Supply Voltage(Max)60 +5V=5, +/-5V=10
Total Supply Voltage(Min)8 +5V=5, +/-5V=10
Vos (Offset Voltage @ 25C)(Max)3 mV

Plan ecológico

RoHSObediente

Kits de diseño y Módulos de evaluación

  • Evaluation Modules & Boards: OPAMPEVM
    Universal Operational Amplifier Evaluation Module
    Estado del ciclo de vida: Activo (Recomendado para nuevos diseños)

Notas de aplicación

  • Optoelectronics Circuit Collection
    PDF, 261 Kb, Archivo publicado: jun 11, 2001
    This application report presents a collection of analog circuits that may be useful in electro-optic applications such as optical networking. The circuits are Avalanche Photodiode Bias Supply 1; Linear TEC Driver-1, -2, and -3; Laser Diode Driver-1 and -2; and Temperature Under- and Over-range Sensing with a Window Comparator.
  • MTTF, Failrate, Reliability, and Life Testing
    PDF, 51 Kb, Archivo publicado: oct 4, 2000
    At Burr-Brown, we characterize and qualify the reliability of our devices through high temperature life testing. The results of this testing are quantified with such values as MTTF and failure rate. This information can be very valuable when used for comparative purposes or applied to reliablility calculations. However, this information loses its worth if it is not precisely understood and appropr

Linea modelo

Clasificación del fabricante

  • Semiconductors > Amplifiers > Operational Amplifiers (Op Amps) > Power Op Amps