Datasheet Texas Instruments ADS5484 — Ficha de datos

FabricanteTexas Instruments
SerieADS5484
Datasheet Texas Instruments ADS5484

Convertidor analógico a digital (ADC) de 16 bits y 170 MSPS

Hojas de datos

16-Bit, 170/200-MSPS Analog-to-Digital Converters datasheet
PDF, 2.4 Mb, Revisión: C, Archivo publicado: oct 8, 2009
Extracto del documento

Precios

Estado

ADS5484IRGCT
Estado del ciclo de vidaActivo (Recomendado para nuevos diseños)
Disponibilidad de muestra del fabricanteNo

Embalaje

ADS5484IRGCT
N1
Pin64
Package TypeRGC
Industry STD TermVQFN
JEDEC CodeS-PQFP-N
Package QTY250
CarrierSMALL T&R
Device MarkingAZ5484
Width (mm)9
Length (mm)9
Thickness (mm).88
Pitch (mm).5
Max Height (mm)1
Mechanical DataDescargar

Paramétricos

Parameters / ModelsADS5484IRGCT
ADS5484IRGCT
# Input Channels1
Analog Input BW, MHz730
ArchitecturePipeline
DNL(Max), +/-LSB1
DNL(Typ), +/-LSB0.5
ENOB, Bits12.05
INL(Max), +/-LSB10
INL(Typ), +/-LSB3
Input BufferYes
Input Range, Vp-p3
InterfaceParallel LVDS
Operating Temperature Range, C-40 to 85
Package GroupVQFN
Package Size: mm2:W x L, PKG64VQFN: 81 mm2: 9 x 9(VQFN)
Power Consumption(Typ), mW2160
RatingCatalog
Reference ModeExt,Int
Resolution, Bits16
SFDR, dB87
SINAD, dB74.3
SNR, dB75.7
Sample Rate(Max), MSPS170

Plan ecológico

ADS5484IRGCT
RoHSObediente

Notas de aplicación

  • Input Impedance Measurement Using ADC FFT Data
    PDF, 275 Kb, Archivo publicado: enero 11, 2011
    Texas Instruments has introduced a family of high-speed analog-to-digital converters (ADCs) suited tomeet the demand for high-speed and high-IF sampling systems. To achieve the highest overall system performance, an analog front-end circuit with an antialiasing filter must drive the ADC with the highestpossible dynamic range and lowest distortions. One important parameter of the front-end circ
  • High-Speed Analog-to-Digital Converter Basics
    PDF, 1.1 Mb, Archivo publicado: enero 11, 2012
    The goal of this document is to introduce a wide range of theories and topics that are relevant tohigh-speed analog-to-digital converters (ADC). This document provides details on sampling theorydata-sheet specifications ADC selection criteria and evaluation methods clock jitter and other commonsystem-level concerns. In addition some end-users will want to extend the performance capabil
  • QFN Layout Guidelines
    PDF, 1.3 Mb, Archivo publicado: jul 28, 2006
    Board layout and stencil information for most Texas Instruments Quad Flat No-Lead (QFN) devices is provided in their data sheets. This document helps printed-circuit board designers understand and better use this information for optimal designs.
  • Design Considerations for Avoiding Timing Errors during High-Speed ADC, LVDS Dat (Rev. A)
    PDF, 2.0 Mb, Revisión: A, Archivo publicado: mayo 22, 2015
  • Why Use Oversampling when Undersampling Can Do the Job? (Rev. A)
    PDF, 1.2 Mb, Revisión: A, Archivo publicado: jul 19, 2013
  • Smart Selection of ADC/DAC Enables Better Design of Software-Defined Radio
    PDF, 376 Kb, Archivo publicado: abr 28, 2009
    This application report explains different aspects of selecting analog-to-digital and digital-to-analog data converters for Software-Defined Radio (SDR) applications. It also explains how ADS61xx ADCs and the DAC5688 from Texas Instruments fit properly for SDR designs.
  • Driving High-Speed ADCs: Circuit Topologies and System-Level Parameters (Rev. A)
    PDF, 327 Kb, Revisión: A, Archivo publicado: sept 10, 2010
    This application report discusses the performance-related aspects of passive and active interfaces at the analog input of high-speed pipeline analog-to-digital converters (ADCs). The report simplifies the many possibilities into two main categories: passive and active interface circuits. The first section of the report gives an overview of equivalent models of buffered and unbuffered ADC input cir
  • Phase Noise Performance and Jitter Cleaning Ability of CDCE72010
    PDF, 2.3 Mb, Archivo publicado: jun 2, 2008
    This application report presents phase noise data taken on the CDCE72010 jitter cleaner and synchronizer PLL device. The phase noise performance of the CDCE72010 depends on the phase noise of the reference clock VCXO clock and the CDCE72010 itself. This application report shows the phase noise performance at several of the most popular CDMA frequencies. This data helps the user to choose the rig
  • CDCE72010 as a Clocking Solution for High-Speed Analog-to-Digital Converters
    PDF, 424 Kb, Archivo publicado: jun 8, 2008
    Texas Instruments has recently introduced a family of devices suitable to meet the demands of high-speed high-IF sampling analog-to-digital converters (ADCs) such as the ADS5483 which is capable of sampling up to 135 MSPS. To realize the full potential of these high-performance devices the system must provide an extremely low phase noise clock source. The CDCE72010 clock synthesizer chip offers
  • Principles of Data Acquisition and Conversion (Rev. A)
    PDF, 132 Kb, Revisión: A, Archivo publicado: abr 16, 2015
  • A Glossary of Analog-to-Digital Specifications and Performance Characteristics (Rev. B)
    PDF, 425 Kb, Revisión: B, Archivo publicado: oct 9, 2011
    This glossary is a collection of the definitions of Texas Instruments' Delta-Sigma (О”ОЈ), successive approximation register (SAR), and pipeline analog-to-digital (A/D) converter specifications and performance characteristics. Although there is a considerable amount of detail in this document, the product data sheet for a particular product specification is the best and final reference.
  • Analog-to-Digital Converter Grounding Practices Affect System Performance (Rev. A)
    PDF, 69 Kb, Revisión: A, Archivo publicado: mayo 18, 2015

Linea modelo

Serie: ADS5484 (1)

Clasificación del fabricante

  • Semiconductors> Data Converters> Analog-to-Digital Converters (ADCs)> High Speed ADCs (>10MSPS)