Datasheet Texas Instruments SNJ54BCT8240AFK — Ficha de datos

SN54BCT8240A, SN74BCT8240A
SCAN TEST DEVICES
WITH OCTAL INVERTING BUFFERS
SCBS067E – FEBRUARY 1990 – REVISED DECEMBER 1996 D
D
D
D D description
The ’BCT8240A scan test devices with octal
buffers are members of the Texas Instruments
SCOPEпЈЄ testability integrated-circuit family. This
family of devices supports IEEE Standard
1149.1-1990 boundary scan to facilitate testing of
complex circuit-board assemblies. Scan access
to the test circuitry is accomplished via the 4-wire
test access port (TAP) interface. SN54BCT8240A . JT PACKAGE
SN74BCT8240A . DW OR NT PACKAGE
(TOP VIEW) 1OE
1Y1
1Y2
1Y3
1Y4
GND
2Y1 …