Datasheet Texas Instruments ADS7813PB — Ficha de datos

FabricanteTexas Instruments
SerieADS7813
Numero de parteADS7813PB
Datasheet Texas Instruments ADS7813PB

Convertidor analógico a digital de muestreo en serie de 16 bits de baja potencia 16-PDIP

Hojas de datos

Low-Power, Serial 16-Bit Sampling Analog-To-Digital Converter datasheet
PDF, 1.1 Mb, Revisión: C, Archivo publicado: sept 13, 2005
Extracto del documento

Precios

Estado

Estado del ciclo de vidaObsoleto (El fabricante ha interrumpido la producción del dispositivo)
Disponibilidad de muestra del fabricanteNo

Embalaje

Pin1616
Package TypeNN
Industry STD TermPDIPPDIP
JEDEC CodeR-PDIP-TR-PDIP-T
CarrierTUBETUBE
Device MarkingBADS7813P
Width (mm)6.356.35
Length (mm)19.319.3
Thickness (mm)3.93.9
Pitch (mm)2.542.54
Max Height (mm)5.085.08
Mechanical DataDescargarDescargar

Paramétricos

# Input Channels1
Analog Voltage AVDD(Max)5.25 V
Analog Voltage AVDD(Min)4.75 V
ArchitectureSAR
Digital Supply(Max)5.25 V
Digital Supply(Min)4.75 V
INL(Max)2 +/-LSB
Input Range(Max)10 V
Input Range(Min)-10 V
Input TypeSingle-Ended
Integrated FeaturesN/A
InterfaceSPI
Multi-Channel ConfigurationN/A
Operating Temperature Range-40 to 85 C
Package GroupSOIC
Package Size: mm2:W x L16SOIC: 106 mm2: 10.3 x 10.3(SOIC) PKG
Power Consumption(Typ)35 mW
RatingCatalog
Reference ModeExt,Int
Resolution16 Bits
SINADN/A dB
SNR89 dB
Sample Rate (max)40kSPS SPS
Sample Rate(Max)0.04 MSPS
THD(Typ)-98 dB

Plan ecológico

RoHSDesobediente

Notas de aplicación

  • Upgrading from the ADS7813 to the ADS8513
    PDF, 85 Kb, Archivo publicado: dic 3, 2007
    This application report applies to current designs using the Texas Instruments ADS7813 device in a surface-mount SO-16 (DW) package. This document guidesusers of the ADS78xx device, with regards to potential compatibility issues that can be encountered when upgrading to the new ADS85xx part series.
  • Determining Minimum Acquisition Times for SAR ADCs, part 1 (Rev. A)
    PDF, 227 Kb, Revisión: A, Archivo publicado: nov 10, 2010
    This application report analyzes a simple method for calculating minimum acquisition times for successive-approximation register analog-to-digital converters (SAR ADCs). The input structure of the ADC is examined along with the driving circuit. The voltage on the sampling capacitor is then determined for the case when a step function is applied to the input of the driving circuit. Three different
  • Determining Minimum Acquisition Times for SAR ADCs, part 2
    PDF, 215 Kb, Archivo publicado: marzo 17, 2011
    The input structure circuit of a successive-approximation register analog-to-digital converter (SAR ADC) incombination with the driving circuit forms a transfer function that can be used to determine minimum acquisition times for different types of applied input signals. This application report, which builds on Determining Minimum Acquisition Times for SAR ADCs When a Step Function is Applied to
  • Analog-to-Digital Converter Grounding Practices Affect System Performance (Rev. A)
    PDF, 69 Kb, Revisión: A, Archivo publicado: mayo 18, 2015
  • A Glossary of Analog-to-Digital Specifications and Performance Characteristics (Rev. B)
    PDF, 425 Kb, Revisión: B, Archivo publicado: oct 9, 2011
    This glossary is a collection of the definitions of Texas Instruments' Delta-Sigma (О”ОЈ), successive approximation register (SAR), and pipeline analog-to-digital (A/D) converter specifications and performance characteristics. Although there is a considerable amount of detail in this document, the product data sheet for a particular product specification is the best and final reference.
  • Principles of Data Acquisition and Conversion (Rev. A)
    PDF, 132 Kb, Revisión: A, Archivo publicado: abr 16, 2015

Linea modelo

Clasificación del fabricante

  • Semiconductors > Data Converters > Analog-to-Digital Converters (ADCs) > Precision ADCs (<=10MSPS)