Datasheet ADIS16260, ADIS16265 (Analog Devices) - 3

FabricanteAnalog Devices
DescripciónProgrammable Digital Gyroscope Sensor
Páginas / Página20 / 3 — Data Sheet. ADIS16260/ADIS16265. SPECIFICATIONS. Table 1. Parameter. Test …
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Data Sheet. ADIS16260/ADIS16265. SPECIFICATIONS. Table 1. Parameter. Test Conditions/Comments. Min. Typ. Max. Unit

Data Sheet ADIS16260/ADIS16265 SPECIFICATIONS Table 1 Parameter Test Conditions/Comments Min Typ Max Unit

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Data Sheet ADIS16260/ADIS16265 SPECIFICATIONS
TA = −40°C to +105°C, VCC = 5.0 V, angular rate = 0°/sec, ±1 g, ±320°/sec range setting, unless otherwise noted.
Table 1. Parameter Test Conditions/Comments Min Typ Max Unit
SENSITIVITY1 Clockwise rotation is positive output 25°C, dynamic range = ±320°/sec2 0.07326 °/sec/LSB 25°C, dynamic range = ±160°/sec 0.03663 °/sec/LSB 25°C, dynamic range = ±80°/sec 0.01832 °/sec/LSB Initial Tolerance 25°C, dynamic range = ±320°/sec ±0.2 ±1 % Temperature Coefficient ADIS16260 125 ppm/°C ADIS16265 25 ppm/°C Nonlinearity Best fit straight line 0.1 % of FS BIAS In-Run Bias Stability 25°C, 1σ 0.007 °/sec Turn-On-to-Turn-On Bias Stability 25°C, 1σ 0.025 °/sec Angular Random Walk 25°C, 1σ 2 °/√hour Temperature Coefficient ADIS16260 0.03 °/sec/°C ADIS16265 0.005 °/sec/°C Linear Acceleration Effect Any axis 0.2 °/sec/g Voltage Sensitivity VCC = 4.75 V to 5.25 V 0.5 °/sec/V NOISE PERFORMANCE Output Noise 25°C, ±320°/sec range, no filtering, 50 Hz, 256 SPS 0.4 °/sec rms 25°C, ±320°/sec range, no filtering, 330 Hz, 2048 SPS 0.9 °/sec rms 25°C, ±160°/sec range, 4-tap filter setting, 50 Hz 0.2 °/sec rms 25°C, ±80°/sec range, 16-tap filter setting, 50 Hz 0.1 °/sec rms Rate Noise Density 25°C, f = 25 Hz, ±320°/sec range, no filtering 0.044 °/sec/√Hz rms FREQUENCY RESPONSE 3 dB Bandwidth SENS_AVG[7] = 0 50 Hz SENS_AVG[7] = 1 330 Hz Sensor Resonant Frequency 14 kHz SELF-TEST STATE Change for Positive Stimulus 320°/sec dynamic range setting +575 +1100 +1500 LSB Change for Negative Stimulus 320°/sec dynamic range setting −575 −1100 −1500 LSB Internal Self-Test Cycle Time 25 ms ADC INPUT Resolution 12 Bits Integral Nonlinearity ±2 LSB Differential Nonlinearity ±1 LSB Offset Error ±4 LSB Gain Error ±2 LSB Input Range 0 2.5 V Input Capacitance During acquisition 20 pF ON-CHIP VOLTAGE REFERENCE 2.5 V Accuracy 25°C −10 +10 mV Temperature Coefficient ±40 ppm/°C Output Impedance 70 Ω Rev. E | Page 3 of 20 Document Outline Features Applications General Description Functional Block Diagram Table of Contents Revision History Specifications Timing Specifications Timing Diagrams Absolute Maximum Ratings ESD Caution Pin Configuration and Function Descriptions Typical Performance Characteristics Theory of Operation Sensing Element Data Sampling and Processing User Interface SPI Interface User Registers Basic Operation SPI Write Commands SPI Read Commands Memory Map Processing Sensor Data Operational Controls Internal Sample Rate Sensor Bandwidth Digital Filtering Dynamic Range Calibration Global Commands Power Management Input/Output Functions General-Purpose I/O Data Ready I/O Indicator Auxiliary DAC Diagnostics Self-Test Memory Test Status Alarm Registers Product Identification Applications Information Assembly Bias Optimization Interface Printed Circuit Board (PCB) Outline Dimensions Ordering Guide