Datasheet RH1014M (Analog Devices) - 4
| Fabricante | Analog Devices |
| Descripción | Quad Precision Operational Amplifier |
| Páginas / Página | 6 / 4 — TABLE 2: ELECTRICAL TEST REQUIREMENTS MIL-STD-883 TEST REQUIREMENTS. … |
| Revisión | H |
| Formato / tamaño de archivo | PDF / 564 Kb |
| Idioma del documento | Inglés |
TABLE 2: ELECTRICAL TEST REQUIREMENTS MIL-STD-883 TEST REQUIREMENTS. SUBGROUP. PDA Test Notes. TOTAL DOSE BIAS CIRCUIT
Línea de modelo para esta hoja de datos
Versión de texto del documento
RH1014M
TABLE 2: ELECTRICAL TEST REQUIREMENTS MIL-STD-883 TEST REQUIREMENTS SUBGROUP PDA Test Notes
Final Electrical Test Requirements (Method 5004) 1*,2,3,4,5,6 The PDA is specified as 5% based on failures from group A, subgroup 1, tests after cooldown as the final electrical test in accordance with method Group A Test Requirements (Method 5005) 1,2,3,4,5,6 5004 of MIL-STD-883. The verified failures of group A, subgroup 1, after Group B and D for Class S 1,2,3 burn-in divided by the total number of devices submitted for burn-in in End Point Electrical Parameters (Method 5005) that lot shall be used to determine the percent for the lot. Analog Devices, Inc. reserves the right to test to tighter limits than those * PDA applies to subgroup 1. See PDA Test Notes. given. Final Electrical Test Requirements (Method 5004) 1*,2,3,4,5,6
TOTAL DOSE BIAS CIRCUIT
Group A Test Requirements (Method 5005) 1,2,3,4,5,6 Group B and D for Class S 1,2,3 End Point Electrical Parameters (Method 5005) 10k * PDA applies to subgroup 1. See PDA Test Notes. 15V – 10k 8V + –15V RH1014M TDBC
TYPICAL PERFORMANCE CHARACTERISTICS Supply Current (Per Amplifier) Positive Slew Rate Negative Slew Rate
0.8 0.8 0.8 VS = ±15V V V S = ±15V S = ±15V RL = 10k RL = 10k RL = 10k 0.6 0.6 0.6 0.4 0.4 0.4 SUPPLY CURRENT (mA) 0.2 0.2 0.2 POSITIVE SLEW RATE (V/µs) NEGATIVE SLEW RATE (V/µs) 0 0 0 1 10 100 1000 1 10 100 1000 1 10 100 1000 TOTAL DOSE KRAD (Si) TOTAL DOSE KRAD (Si) TOTAL DOSE KRAD (Si) RH1014M G01 RH1014M G02 RH1014M G03 Rev. H 4 For more information www.analog.com Document Outline Description Burn-In Circuit Absolute Maximum Ratings Package Information Table 1: Electrical characteristics Table 1a: Electrical characteristics Table 2: Electrical Test Requirements Total Dose Bias Circuit Typical Performance Characteristics Revision History
TABLE 2: ELECTRICAL TEST REQUIREMENTS MIL-STD-883 TEST REQUIREMENTS SUBGROUP PDA Test Notes
Final Electrical Test Requirements (Method 5004) 1*,2,3,4,5,6 The PDA is specified as 5% based on failures from group A, subgroup 1, tests after cooldown as the final electrical test in accordance with method Group A Test Requirements (Method 5005) 1,2,3,4,5,6 5004 of MIL-STD-883. The verified failures of group A, subgroup 1, after Group B and D for Class S 1,2,3 burn-in divided by the total number of devices submitted for burn-in in End Point Electrical Parameters (Method 5005) that lot shall be used to determine the percent for the lot. Analog Devices, Inc. reserves the right to test to tighter limits than those * PDA applies to subgroup 1. See PDA Test Notes. given. Final Electrical Test Requirements (Method 5004) 1*,2,3,4,5,6
TOTAL DOSE BIAS CIRCUIT
Group A Test Requirements (Method 5005) 1,2,3,4,5,6 Group B and D for Class S 1,2,3 End Point Electrical Parameters (Method 5005) 10k * PDA applies to subgroup 1. See PDA Test Notes. 15V – 10k 8V + –15V RH1014M TDBC
TYPICAL PERFORMANCE CHARACTERISTICS Supply Current (Per Amplifier) Positive Slew Rate Negative Slew Rate
0.8 0.8 0.8 VS = ±15V V V S = ±15V S = ±15V RL = 10k RL = 10k RL = 10k 0.6 0.6 0.6 0.4 0.4 0.4 SUPPLY CURRENT (mA) 0.2 0.2 0.2 POSITIVE SLEW RATE (V/µs) NEGATIVE SLEW RATE (V/µs) 0 0 0 1 10 100 1000 1 10 100 1000 1 10 100 1000 TOTAL DOSE KRAD (Si) TOTAL DOSE KRAD (Si) TOTAL DOSE KRAD (Si) RH1014M G01 RH1014M G02 RH1014M G03 Rev. H 4 For more information www.analog.com Document Outline Description Burn-In Circuit Absolute Maximum Ratings Package Information Table 1: Electrical characteristics Table 1a: Electrical characteristics Table 2: Electrical Test Requirements Total Dose Bias Circuit Typical Performance Characteristics Revision History