Datasheet AD5520 (Analog Devices) - 21
| Fabricante | Analog Devices |
| Descripción | Per Pin Parametric Measurement Unit/Source Measure Unit |
| Páginas / Página | 24 / 21 — AD5520. TYPICAL APPLICATION CIRCUIT. CENTRAL PMU. DAC. GUARD AMP. PPMU. … |
| Revisión | B |
| Formato / tamaño de archivo | PDF / 520 Kb |
| Idioma del documento | Inglés |
AD5520. TYPICAL APPLICATION CIRCUIT. CENTRAL PMU. DAC. GUARD AMP. PPMU. ADC. VCH. VTERM. TIMING DATA. DEVICE UNDER. MEMORY. TEST (DUT). RELAYS
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AD5520 TYPICAL APPLICATION CIRCUIT
Figure 27 shows the AD5520 as in an ATE system. This device The flexible function of the AD5520 also makes it suited for use can used as a per pin parametric unit in order to speed up the in instrumentation applications such as source measure units. rate at which testing can be done. It can also be used as a DUT Source measure units are programmable instruments capable of power supply, as shown in the application circuit. sourcing and measuring voltage or current simultaneously. The AD5520 provides a more integrated solution in such The central PMU shown in the block diagram (Figure 27) is equipment. usually a highly accurate PMU and is shared among a number of pins in the tester. In general, many discrete levels are required in an ATE system for the pin drivers, comparators, clamps, and active loads. DAC devices, such as the AD5379, offer a highly integrated solution for a number of these levels. The AD5379 is a dense 40-channel DAC designed with high channel requirements, such as ATE.
CENTRAL PMU DAC GUARD AMP PPMU ADC DAC VCH DAC ADC VTERM DAC TIMING DATA VH DEVICE UNDER DAC MEMORY TEST (DUT) RELAYS 50
Ω
COAX TIMING FORMATTER GENERATOR DRIVER DE-SKEW DLL, LOGIC DAC VL VCL GUARD AMP DAC GND SENSE DAC DEVICE POWER SUPPLIES VTH COMPARE DAC FORMATTER COMP MEMORY DE-SKEW VTL ADC DAC ACTIVE LOAD IOL DAC VCOM DAC IOH DAC
03701-027 Figure 27. Typical Application ATE Circuit Rev. B | Page 21 of 24 Document Outline FEATURES APPLICATIONS GENERAL DESCRIPTION FUNCTIONAL BLOCK DIAGRAM TABLE OF CONTENTS SPECIFICATIONS TIMING CHARACTERISTICS ABSOLUTE MAXIMUM RATINGS ESD CAUTION PIN CONFIGURATION AND FUNCTION DESCRIPTIONS TYPICAL PERFORMANCE CHARACTERISTICS THEORY OF OPERATION INTERFACE STANDBY MODE FORCE VOLTAGE OR FORCE CURRENT MEASURED PARAMETER CURRENT RANGES RS SELECTION FORCE CONTROL AMPLIFIER COMPARATOR FUNCTION AND STROBING CLAMP FUNCTION HIGH CURRENT RANGES CIRCUIT OPERATION FORCE VOLTAGE MEASURE CURRENT FORCE CURRENT MEASURE VOLTAGE SHORT CIRCUIT PROTECTION SETTLING TIME CONSIDERATIONS PCB LAYOUT AND POWER SUPPLY DECOUPLING TYPICAL CONNECTION CIRCUIT FOR THE AD5520 TYPICAL APPLICATION CIRCUIT EVALUATION BOARD FOR THE AD5520 OUTLINE DIMENSIONS ORDERING GUIDE
AD5520 TYPICAL APPLICATION CIRCUIT
Figure 27 shows the AD5520 as in an ATE system. This device The flexible function of the AD5520 also makes it suited for use can used as a per pin parametric unit in order to speed up the in instrumentation applications such as source measure units. rate at which testing can be done. It can also be used as a DUT Source measure units are programmable instruments capable of power supply, as shown in the application circuit. sourcing and measuring voltage or current simultaneously. The AD5520 provides a more integrated solution in such The central PMU shown in the block diagram (Figure 27) is equipment. usually a highly accurate PMU and is shared among a number of pins in the tester. In general, many discrete levels are required in an ATE system for the pin drivers, comparators, clamps, and active loads. DAC devices, such as the AD5379, offer a highly integrated solution for a number of these levels. The AD5379 is a dense 40-channel DAC designed with high channel requirements, such as ATE.
CENTRAL PMU DAC GUARD AMP PPMU ADC DAC VCH DAC ADC VTERM DAC TIMING DATA VH DEVICE UNDER DAC MEMORY TEST (DUT) RELAYS 50
Ω
COAX TIMING FORMATTER GENERATOR DRIVER DE-SKEW DLL, LOGIC DAC VL VCL GUARD AMP DAC GND SENSE DAC DEVICE POWER SUPPLIES VTH COMPARE DAC FORMATTER COMP MEMORY DE-SKEW VTL ADC DAC ACTIVE LOAD IOL DAC VCOM DAC IOH DAC
03701-027 Figure 27. Typical Application ATE Circuit Rev. B | Page 21 of 24 Document Outline FEATURES APPLICATIONS GENERAL DESCRIPTION FUNCTIONAL BLOCK DIAGRAM TABLE OF CONTENTS SPECIFICATIONS TIMING CHARACTERISTICS ABSOLUTE MAXIMUM RATINGS ESD CAUTION PIN CONFIGURATION AND FUNCTION DESCRIPTIONS TYPICAL PERFORMANCE CHARACTERISTICS THEORY OF OPERATION INTERFACE STANDBY MODE FORCE VOLTAGE OR FORCE CURRENT MEASURED PARAMETER CURRENT RANGES RS SELECTION FORCE CONTROL AMPLIFIER COMPARATOR FUNCTION AND STROBING CLAMP FUNCTION HIGH CURRENT RANGES CIRCUIT OPERATION FORCE VOLTAGE MEASURE CURRENT FORCE CURRENT MEASURE VOLTAGE SHORT CIRCUIT PROTECTION SETTLING TIME CONSIDERATIONS PCB LAYOUT AND POWER SUPPLY DECOUPLING TYPICAL CONNECTION CIRCUIT FOR THE AD5520 TYPICAL APPLICATION CIRCUIT EVALUATION BOARD FOR THE AD5520 OUTLINE DIMENSIONS ORDERING GUIDE