Datasheet MBD701, MMBD701L, SMMBD701L (ON Semiconductor) - 3
| Fabricante | ON Semiconductor |
| Descripción | Silicon Hot-Carrier Diodes Schottky Barrier Diodes |
| Páginas / Página | 6 / 3 — MBD701, MMBD701L, SMMBD701L. TYPICAL ELECTRICAL CHARACTERISTICS. Figure … |
| Revisión | 7 |
| Formato / tamaño de archivo | PDF / 188 Kb |
| Idioma del documento | Inglés |
MBD701, MMBD701L, SMMBD701L. TYPICAL ELECTRICAL CHARACTERISTICS. Figure 1. Total Capacitance
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MBD701, MMBD701L, SMMBD701L TYPICAL ELECTRICAL CHARACTERISTICS
2.0 500 f = 1.0 MHz 1.6 (pF) 400 KRAKAUER METHOD ANCE 1.2 300 ACIT CAP 0.8 AL 200 , TOT TC 0.4 100 , MINORITY CARRIER LIFETIME (ps) t 0 0 0 5.0 10 15 20 25 30 35 40 45 50 0 10 20 30 40 50 60 70 80 90 100 VR, REVERSE VOLTAGE (VOLTS) IF, FORWARD CURRENT (mA)
Figure 1. Total Capacitance Figure 2. Minority Carrier Lifetime
10 100 T A) A = 100°C m 1.0 10 T T A = 85°C A = -40°C TA = 75°C 0.1 ARD CURRENT (mA) 1.0 T , REVERSE LEAKAGE ( 0.01 , FORW A = 25°C T I R A = 25°C I F 0.001 0.1 0 10 20 30 40 50 0 0.2 0.4 0.8 1.2 1.6 2.0 VR, REVERSE VOLTAGE (VOLTS) VF, FORWARD VOLTAGE (VOLTS)
Figure 3. Reverse Leakage Figure 4. Forward Voltage
IF(PEAK) CAPACITIVE CONDUCTION IR(PEAK) FORWARD STORAGE CONDUCTION CONDUCTION BALLAST SAMPLING SINUSOIDAL NETWORK PADS OSCILLOSCOPE GENERATOR (PADS) (50 W INPUT) DUT
Figure 5. Krakauer Method of Measuring Lifetime www.onsemi.com 3
2.0 500 f = 1.0 MHz 1.6 (pF) 400 KRAKAUER METHOD ANCE 1.2 300 ACIT CAP 0.8 AL 200 , TOT TC 0.4 100 , MINORITY CARRIER LIFETIME (ps) t 0 0 0 5.0 10 15 20 25 30 35 40 45 50 0 10 20 30 40 50 60 70 80 90 100 VR, REVERSE VOLTAGE (VOLTS) IF, FORWARD CURRENT (mA)
Figure 1. Total Capacitance Figure 2. Minority Carrier Lifetime
10 100 T A) A = 100°C m 1.0 10 T T A = 85°C A = -40°C TA = 75°C 0.1 ARD CURRENT (mA) 1.0 T , REVERSE LEAKAGE ( 0.01 , FORW A = 25°C T I R A = 25°C I F 0.001 0.1 0 10 20 30 40 50 0 0.2 0.4 0.8 1.2 1.6 2.0 VR, REVERSE VOLTAGE (VOLTS) VF, FORWARD VOLTAGE (VOLTS)
Figure 3. Reverse Leakage Figure 4. Forward Voltage
IF(PEAK) CAPACITIVE CONDUCTION IR(PEAK) FORWARD STORAGE CONDUCTION CONDUCTION BALLAST SAMPLING SINUSOIDAL NETWORK PADS OSCILLOSCOPE GENERATOR (PADS) (50 W INPUT) DUT
Figure 5. Krakauer Method of Measuring Lifetime www.onsemi.com 3