Datasheet OP400 (Analog Devices) - 10

FabricanteAnalog Devices
DescripciónLow Offset, Low Power Quad Op Amp
Páginas / Página12 / 10 — STANDARD. 5962-87771. MICROCIRCUIT DRAWING
Formato / tamaño de archivoPDF / 81 Kb
Idioma del documentoInglés

STANDARD. 5962-87771. MICROCIRCUIT DRAWING

STANDARD 5962-87771 MICROCIRCUIT DRAWING

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TABLE IIA. Electrical test requirements. Test requirements Subgroups Subgroups (in accordance with (in accordance with MIL-STD-883, MIL-PRF-38535, table III) method 5005, table I) Device Device Device class M class Q class V Interim electrical 1 1 1 parameters (see 4.2) Final electrical 1,2,3,4,7 1/ 1,2,3,4,7 1/ 1,2,3, 1/ 2/ parameters (see 4.2) 4,7,8 Group A test 1,2,3,4,5,6, 1,2,3,4,5,6, 1,2,3,4,5,6, requirements (see 4.4) 7,8 7,8 7,8 Group C end-point electrical 1 1 1,2,3,4,5, 2/ parameters (see 4.4) 6,7,8 Group D end-point electrical 1 1 1 parameters (see 4.4) Group E end-point electrical --- --- 1,4 parameters (see 4.4) 1/ PDA applies to subgroup 1. 2/ Delta limits in accordance with table IIB shall be computed with reference to the previous interim electrical parameters. TABLE IIB. 240 hour burn-in and group C end-point electrical parameters. Limit Delta Test Min Max Min Max Unit VIO -150 150 -75 +75 V +IIB -3 3 -2 2 nA -IIB -3 3 -2 2 nA 4.4.3 Group D inspection. The group D inspection end-point electrical parameters shall be as specified in table IIA herein. 4.4.4 Group E inspection. Group E inspection is required only for parts intended to be marked as radiation hardness assured (see 3.5 herein). a. End-point electrical parameters shall be as specified in table IIA herein. b. For device classes Q and V, the devices or test vehicle shall be subjected to radiation hardness assured tests as specified in MIL-PRF-38535 for the RHA level being tested. For device class M, the devices shall be subjected to radiation hardness assured tests as specified in MIL-PRF-38535, appendix A for the RHA level being tested. All device classes must meet the postirradiation end-point electrical parameter limits as defined in table I at TA = +25C 5C, after exposure, to the subgroups specified in table IIA herein. 4.4.4.1 Total dose irradiation testing. Total dose irradiation testing shall be performed in accordance with MIL-STD-883 method 1019, condition A for device type 01 and as specified herein.
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5962-87771 MICROCIRCUIT DRAWING A
DLA LAND AND MARITIME REVISION LEVEL SHEET COLUMBUS, OHIO 43218-3990 G 10 DSCC FORM 2234 APR 97